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IPC APEX EXPO 2016
Wed, Mar 16, 2016 - 10:00 AM to 10:30 AM
NSOP Reduction for QFN RFIC Packages
Speaker: Mumtaz Bora CID, Sr. Staff Packaging Engineer, Peregrine Semiconductor
Seminar Type: Poster
Location: Bridge Corridor (Level 2)
NSOP Reduction for QFN RFIC Packages
Wed, Mar 16, 2016 - 10:00 AM to 10:30 AM
Plasma Based VOC-Free Fluxing for Selective and Wave Soldering
Speaker: Andreas Reinhardt, SEHO Systems GmbH
Seminar Type: Poster
Location: Bridge Corridor (Level 2)
Plasma Based VOC-Free Fluxing for Selective and Wave Soldering
Wed, Mar 16, 2016 - 10:00 AM to 10:30 AM
Remove Flux Vapors out The Reflow Process Using a Catalytic Thermal Oxidizer
Speaker: Gerjan Diepstraten CIT, Advanced Technology Manager, Vitronics Soltec
Seminar Type: Poster
Location: Bridge Corridor (Level 2)
Remove Flux Vapors out The Reflow Process Using a Catalytic Thermal Oxidizer
Wed, Mar 16, 2016 - 10:00 AM to 10:30 AM
Round Robin of High Frequency Test Methods by IPC-D24C Task Group
Speaker: Glenn Oliver, Design/Applications Engineer, DuPont - RTP
Speaker: Don DeGroot
Seminar Type: Poster
Location: Bridge Corridor (Level 2)
Round Robin of High Frequency Test Methods by IPC-D24C Task Group
Wed, Mar 16, 2016 - 10:00 AM to 10:30 AM
Stencils for Mixed Flip Chip
Speaker: Sue Holmes, Vice President of Customer Support/Design, Photo Stencil Inc.
Seminar Type: Poster
Location: Bridge Corridor (Level 2)
Stencils for Mixed Flip Chip
Wed, Mar 16, 2016 - 10:00 AM to 10:30 AM
Technology Trends, Advances in Device Programming Technology and the Impact on Automotive Electronics Manufacturing
Speaker: Anthony Ambrose, CEO/President, Data I/O Corporation
Seminar Type: Poster
Location: Bridge Corridor (Level 2)
Technology Trends, Advances in Device Programming Technology and the Impact on Automotive Electronic
Wed, Mar 16, 2016 - 10:00 AM to 10:30 AM
The Automation of ICT with Collaborative Robotics
Speaker: Carl Palme, Rethink Robotics
Seminar Type: Poster
Location: Bridge Corridor (Level 2)
The Automation of ICT with Collaborative Robotics
Wed, Mar 16, 2016 - 10:00 AM to 10:30 AM
The Corrosivity Level Monitoring of Gases Contamination in Data Center by Way of Coulometric Reduction Methodology
Speaker: Dem Lee, iST-Integrated Service Technology
Seminar Type: Poster
Location: Bridge Corridor (Level 2)
The Corrosivity Level Monitoring of Gases Contamination in Data Center by Way of Coulometric Reducti
Wed, Mar 16, 2016 - 10:15 AM to 12:00 PM
4-14: Plating Processes Subcommittee
Gerard O'Brien
George Milad
Seminar Type: Standards Development Committee Meeting
General Committee: Fabrication Processes
Topic/Track: PCB Fabrication and Materials
Location: S104
Wed, Mar 16, 2016 - 10:15 AM to 11:00 AM
7-23: Assembly Process Effects Handbook Subcommittee
Greg Hurst
Sharon Ventress
Seminar Type: Standards Development Committee Meeting
General Committee: Process Control
Location: S103
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